Microwave dielectric properties of Ca1-xSrxMgSi2O6 ceramics

• Published in: Ceramics international Vol. 46; no. 17; pp. 27679 - 27685
• Main Authors: Cai, Chaoyang, Chen, Xiaoqing, Li, Hao, Xiao, Jing, Zhong, Chaowei, Zhang, Shuren
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01-12-2020
• Subjects: Ca1-xSrxMgSi2O6; Microwave dielectric ceramics; Raman spectra; Raman spectra; Ca1-xSrxMgSi2O6; Microwave dielectric ceramics
• ISSN: 0272-8842; 1873-3956
• DOI: 10.1016/j.ceramint.2020.07.265

The influences of Sr2+ doping on microwave dielectric properties of Ca1-xSrxMgSi2O6 (x = 0–0.06) ceramics were researched in the work. The intrinsic mechanism responsible for the dielectric properties was explored by the P–V-L theory and Raman spectra. X-ray diffraction revealed that Ca1-xSrxMgSi2O6 solid solutions were formed when x = 0.02–0.06. The εr continually increased with an increasing x value, which was related to the average bond ionicity and dielectric polarizability. The change of Qf was due to the variation in Si–O bond. The τf was affected by the Ca/Sr–O bond energy. Furthermore, the Ca0·96Sr0·04MgSi2O6 ceramic sintered at 1320 °C possessed optimum dielectric properties (εr = 8.17, Qf = 85858 GHz, and τf = −41.25 ppm/°C).