Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate

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Bibliographic Details
Published in:	Materials science & engineering. B, Solid-state materials for advanced technology Vol. 123; no. 2; pp. 163 - 166
Main Authors:	Pecharapa, W., Keawprajak, A., Kayunkid, N., Rahong, S., Yindeesuk, W., Nukeaw, J.
Format:	Journal Article
Language:	English
Published:	01-11-2005
Online Access:	Get full text
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ISSN:	0921-5107
DOI:	10.1016/j.mseb.2005.07.022