X-ray and electron microscopy techniques as materials science structural characterization tools

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Bibliographic Details
Published in:Acta crystallographica. Section A, Foundations and advances Vol. 79; no. a2; p. C24
Main Authors: Balzuweit, K., Brandão, P. R. G., Almeida, N.G.S., de Faria, C. G., Cetlin, P. R., Aguilar, M. T. P.
Format: Journal Article
Language:English
Published: 22-08-2023
Online Access:Get full text
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Summary:Abstract only
ISSN:2053-2733
2053-2733
DOI:10.1107/S2053273323095852