Approach to high quality GaN lateral nanowires and planar cavities fabricated by focused ion beam and metal-organic vapor phase epitaxy

• Published in: Scientific reports Vol. 8; no. 1; pp. 7218 - 10
• Main Authors: Pozina, Galia, Gubaydullin, Azat R., Mitrofanov, Maxim I., Kaliteevski, Mikhail A., Levitskii, Iaroslav V., Voznyuk, Gleb V., Tatarinov, Evgeniy E., Evtikhiev, Vadim P., Rodin, Sergey N., Kaliteevskiy, Vasily N., Chechurin, Leonid S.
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group UK 08-05-2018; Nature Publishing Group; Nature Portfolio
• Subjects: 140/125; 142/126; 639/301/1019/1020/1089; 639/301/119/1000/1016; 639/624/399/1016; Cavities; Epitaxy; Etching; Growth rate; Humanities and Social Sciences; Ion beams; multidisciplinary; Nanotechnology; Nanowires; Science; Science (multidisciplinary); Silicon nitride; Trenches; Vapors
• ISSN: 2045-2322; 2045-2322
• DOI: 10.1038/s41598-018-25647-7

We have developed a method to fabricate GaN planar nanowires and cavities by combination of Focused Ion Beam (FIB) patterning of the substrate followed by Metal Organic Vapor Phase Epitaxy (MOVPE). The method includes depositing a silicon nitride mask on a sapphire substrate, etching of the trenches in the mask by FIB with a diameter of 40 nm with subsequent MOVPE growth of GaN within trenches. It was observed that the growth rate of GaN is substantially increased due to enhanced bulk diffusion of the growth precursor therefore the model for analysis of the growth rate was developed. The GaN strips fabricated by this method demonstrate effective luminescence properties. The structures demonstrate enhancement of spontaneous emission via formation of Fabry-Perot modes.