The cosmic muon and detector simulation framework of the extreme energy events (EEE) experiment
This paper describes the simulation framework of the extreme energy events (EEE) experiment. EEE is a network of cosmic muon trackers, each made of three multi-gap resistive plate chambers (MRPC), able to precisely measure the absolute muon crossing time and the muon integrated angular flux at the g...
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Published in: | The European physical journal. C, Particles and fields Vol. 81; no. 5; pp. 1 - 15 |
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Main Authors: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Berlin/Heidelberg
Springer Berlin Heidelberg
01-05-2021
Springer Springer Nature B.V Springer Science + Business Media SpringerOpen |
Subjects: | |
Online Access: | Get full text |
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Summary: | This paper describes the simulation framework of the extreme energy events (EEE) experiment. EEE is a network of cosmic muon trackers, each made of three multi-gap resistive plate chambers (MRPC), able to precisely measure the absolute muon crossing time and the muon integrated angular flux at the ground level. The response of a single MRPC and the combination of three chambers have been implemented in a GEANT4-based framework (GEMC) to study the telescope response. The detector geometry, as well as details about the surrounding materials and the location of the telescopes have been included in the simulations in order to realistically reproduce the experimental set-up of each telescope. A model based on the latest parametrization of the cosmic muon flux has been used to generate single muon events. After validating the framework by comparing simulations to selected EEE telescope data, it has been used to determine detector parameters not accessible by analysing experimental data only, such as detection efficiency, angular and spatial resolution. |
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Bibliography: | AC05-06OR23177 USDOE Office of Science (SC), Nuclear Physics (NP) |
ISSN: | 1434-6044 1434-6052 |
DOI: | 10.1140/epjc/s10052-021-09237-y |