Reciprocal space imaging of ionic correlations in intercalation compounds
The intercalation of alkali ions into layered materials has played an essential role in battery technology since the development of the first lithium-ion electrodes. Coulomb repulsion between the intercalants leads to ordering of the intercalant sublattice, which hinders ionic diffusion and impacts...
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Published in: | Nature materials Vol. 19; no. 1; pp. 63 - 68 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
London
Nature Publishing Group UK
01-01-2020
Nature Publishing Group |
Subjects: | |
Online Access: | Get full text |
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Summary: | The intercalation of alkali ions into layered materials has played an essential role in battery technology since the development of the first lithium-ion electrodes. Coulomb repulsion between the intercalants leads to ordering of the intercalant sublattice, which hinders ionic diffusion and impacts battery performance. While conventional diffraction can identify the long-range order that can occur at discrete intercalant concentrations during the charging cycle, it cannot determine short-range order at other concentrations that also disrupt ionic mobility. In this Article, we show that the use of real-space transforms of single-crystal diffuse scattering, measured with high-energy synchrotron X-rays, allows a model-independent measurement of the temperature dependence of the length scale of ionic correlations along each of the crystallographic axes in sodium-intercalated V
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. The techniques described here provide a new way of probing the evolution of structural ordering in crystalline materials.
Conventional diffraction cannot determine short-range order at concentrations that disrupt ionic mobility. Real-space transforms of single-crystal diffuse scattering now allow us to measure ionic correlation length scales in sodium-intercalated V
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1476-1122 1476-4660 |
DOI: | 10.1038/s41563-019-0500-7 |