Dielectric relaxation, resonance and scaling behaviors in Sr3Co2Fe24O41 hexaferrite

• Published in: Scientific reports Vol. 5; no. 1; p. 13645
• Main Authors: Tang, Rujun, Jiang, Chen, Qian, Wenhu, Jian, Jie, Zhang, Xin, Wang, Haiyan, Yang, Hao
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group UK 28-08-2015; Nature Publishing Group
• Subjects: 639/301; 639/766; Behavior; Carbon dioxide; Dielectric properties; Electrical properties; Frequency dependence; High temperature; Humanities and Social Sciences; Low temperature; multidisciplinary; Resonance; Scaling; Science; Temperature effects
• ISSN: 2045-2322; 2045-2322
• DOI: 10.1038/srep13645

The dielectric properties of
Z
-type hexaferrite Sr
3
Co
2
Fe
24
O
41
(SCFO) have been investigated as a function of temperature from 153 to 503 K between 1 and 2 GHz. The dielectric responses of SCFO are found to be frequency dependent and thermally activated. The relaxation-type dielectric behavior is observed to be dominating in the low frequency region and resonance-type dielectric behavior is found to be dominating above 10
8
 Hz. This frequency dependence of dielectric behavior is explained by the damped harmonic oscillator model with temperature dependent coefficients. The imaginary part of impedance (
Z
″) and modulus (
M
″) spectra show that there is a distribution of relaxation times. The scaling behaviors of
Z
″ and
M
″ spectra further suggest that the distribution of relaxation times is temperature independent at low frequencies. The dielectric loss spectra at different temperatures have not shown a scaling behavior above 10
8
 Hz. A comparison between the
Z
″ and the
M
″ spectra indicates that the short-range charges motion dominates at low temperatures and the long-range charges motion dominates at high temperatures. The above results indicate that the dielectric dispersion mechanism in SCFO is temperature independent at low frequencies and temperature dependent at high frequencies due to the domination of resonance behavior.