Low angle tilt boundary migration coupled to shear deformation

The shear stress induced migration of planar 〈1 0 0〉 tilt grain boundaries in Al bicrystals was observed to be perfectly coupled to the lateral translation of grains. Boundaries with misorientations of 10.5° and 12.0° on one side of the misorientation range (0–90°) and 81.0° and 81.1° on its other s...

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Bibliographic Details
Published in:Acta materialia Vol. 55; no. 5; pp. 1843 - 1848
Main Authors: Molodov, D.A., Ivanov, V.A., Gottstein, G.
Format: Journal Article
Language:English
Published: Oxford Elsevier Ltd 01-03-2007
Elsevier Science
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Summary:The shear stress induced migration of planar 〈1 0 0〉 tilt grain boundaries in Al bicrystals was observed to be perfectly coupled to the lateral translation of grains. Boundaries with misorientations of 10.5° and 12.0° on one side of the misorientation range (0–90°) and 81.0° and 81.1° on its other side move in opposite directions under the same applied external stress. The measured ratios of the normal to the lateral motion comply perfectly with the coupling factors of a recently proposed model of boundary motion.
Bibliography:ObjectType-Article-2
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content type line 23
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2006.10.045