Experimental and FEM based investigation of the influence of the deposition temperature on the mechanical properties of SiC coatings
Scanning electron microscopy shows that the microstructure, in particular the overall grain size, of chemical vapor deposited silicon carbide coatings depends on the deposition temperature. So far, the influence of the microstructure on the mechanical properties of such coatings is not well describe...
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Published in: | Journal of advanced ceramics Vol. 10; no. 1; pp. 139 - 151 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
Beijing
Tsinghua University Press
01-02-2021
Springer Springer Nature B.V SGL Carbon GmbH,Werner-von-Siemens-Strasse 18,86405 Meitingen,Germany%Experimental Physics Ⅱ,Institute of Physics,University of Augsburg,86135 Augsburg,Germany%SGL Carbon GmbH,Drachenburgstrasse 1,53170 Bonn,Germany |
Subjects: | |
Online Access: | Get full text |
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Summary: | Scanning electron microscopy shows that the microstructure, in particular the overall grain size, of chemical vapor deposited silicon carbide coatings depends on the deposition temperature. So far, the influence of the microstructure on the mechanical properties of such coatings is not well described in literature. To investigate the influence of the deposition temperature on the mechanical properties of the coating, nanoindentation is used in this work. Since the measurement results of nanoindentation can be affected by the substrate material, the contribution of the substrate material is taken into account utilizing a finite element model. The model is then employed to generate information about elastic and plastic properties of the coating by inverse simulation. To evaluate the fracture toughness of the coating, the generated material model is used in a cohesive-zone based formulation of the fracture process during indentation at higher loads. The results of this model allow determining the fracture toughness of silicon carbide coatings deposited at different temperatures. |
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ISSN: | 2226-4108 2227-8508 |
DOI: | 10.1007/s40145-020-0429-y |