Comparative study of encapsulated solution-processed zinc oxide ultraviolet photodetectors with different contacts

Ultraviolet (UV) photodetectors were fabricated with low temperature (<150 °C) solution‐processed zinc oxide (ZnO) layers. A polydimethylsiloxane (PDMS) layer was used as the encapsulation to protect the devices from ambient effects. Current–voltage (I–V) characteristics, transient characteristic...

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Bibliographic Details
Published in:	Physica status solidi. A, Applications and materials science Vol. 211; no. 9; pp. 2184 - 2188
Main Authors:	Li, Siying, Tang, Wei, Xu, Xiaoli, Cao, Motao, Jin, Yizheng, Guo, Xiaojun
Format:	Journal Article
Language:	English
Published:	Weinheim Blackwell Publishing Ltd 01-09-2014 Wiley Subscription Services, Inc
Subjects:	Aluminum Devices Electrodes Encapsulation Ohmic contact Photodetectors Schottky contact Silicone resins solution process Ultraviolet ultraviolet photodetector Zinc oxide
Online Access:	Get full text
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Summary:	Ultraviolet (UV) photodetectors were fabricated with low temperature (<150 °C) solution‐processed zinc oxide (ZnO) layers. A polydimethylsiloxane (PDMS) layer was used as the encapsulation to protect the devices from ambient effects. Current–voltage (I–V) characteristics, transient characteristics, and the encapsulation effect were compared for ohmic and Schottky contact devices that were formed with aluminum and silver electrodes, respectively. Schottky contact devices were shown to be able to achieve rapid response with the recovery time not affected by the encapsulation.
Bibliography:	National Natural Science Foundation of China - No. 61274083; No. 61334008; No. 51172203 istex:E742D14BB236122F3E6B1E417D7EB0C3F038C390 ark:/67375/WNG-GLWJ4XQL-F ArticleID:PSSA201431220 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	1862-6300 1862-6319
DOI:	10.1002/pssa.201431220