Ge–Sb–S–Se–Te amorphous chalcogenide thin films towards on-chip nonlinear photonic devices

Thanks to their unique optical properties Ge–Sb–S–Se–Te amorphous chalcogenide materials and compounds offer tremendous opportunities of applications, in particular in near and mid-infrared range. This spectral range is for instance of high interest for photonics or optical sensors. Using co-sputter...

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Bibliographic Details
Published in:Scientific reports Vol. 10; no. 1; p. 11894
Main Authors: Dory, J.-B., Castro-Chavarria, C., Verdy, A., Jager, J.-B., Bernard, M., Sabbione, C., Tessaire, M., Fédéli, J.-M., Coillet, A., Cluzel, B., Noé, P.
Format: Journal Article
Language:English
Published: London Nature Publishing Group UK 17-07-2020
Nature Publishing Group
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Summary:Thanks to their unique optical properties Ge–Sb–S–Se–Te amorphous chalcogenide materials and compounds offer tremendous opportunities of applications, in particular in near and mid-infrared range. This spectral range is for instance of high interest for photonics or optical sensors. Using co-sputtering technique of chalcogenide compound targets in a 200 mm industrial deposition tool, we show how by modifying the amorphous structure of GeSb w S x Se y Te z chalcogenide thin films one can significantly tailor their linear and nonlinear optical properties. Modelling of spectroscopic ellipsometry data collected on the as-deposited chalcogenide thin films is used to evaluate their linear and nonlinear properties. Moreover, Raman and Fourier-transform infrared spectroscopies permitted to get a description of their amorphous structure. For the purpose of applications, their thermal stability upon annealing is also evaluated. We demonstrate that depending on the GeSb w S x Se y Te z film composition a trade-off between a high transparency in near- or mid-infrared ranges, strong nonlinearity and good thermal stability can be found in order to use such materials for applications compatible with the standard CMOS integration processes of microelectronics and photonics.
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ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-020-67377-9