Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs

The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of defor...

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Bibliographic Details
Published in:	Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences Vol. 357; no. 1761; pp. 2731 - 2739
Main Authors:	Epelboin, Y., Mocella, V., Soyer, A.
Format:	Journal Article
Language:	English
Published:	The Royal Society 01-10-1999 Royal Society, The
Subjects:	Coherent radiation Condensed Matter Crystals Dynamical Theory Imaging Materials Science Modeling Physics Plane waves Point sources Simulation Simulation programs Spherical waves Synchrotrons Topography Wave diffraction Wavelengths X-Ray Diffraction Simulation Synchrotron Radiation X-ray topography
Online Access:	Get full text
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Summary:	The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of deformation is described.
Bibliography:	ark:/67375/V84-PCJ6L953-6 istex:3F37BB3729FA8FC424CED51FAEC2D23A068A8CF0 Theme Issue 'X-ray topography and crystal characterization' compiled by D. K. Bowen and B. K. Tanner
ISSN:	1364-503X 1471-2962
DOI:	10.1098/rsta.1999.0462