Electronic structure of the TiO thin film on Ag(1 0 0): Angle-resolved photoemission study

• Published in: Surface science Vol. 602; no. 13; pp. 2295 - 2299
• Main Authors: Kaneko, H., Tanaka, M., Ozawa, K., Edamoto, K.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 01-07-2008; Amsterdam Elsevier Science; New York, NY
• Subjects: Angle-resolved photoemission; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics; Silver; Single crystal epitaxy; Surface electronic phenomena; Titanium oxide; Angle-resolved photoemission; Silver; Titanium oxide; Single crystal epitaxy; Surface electronic phenomena; Thin films; Electronic structure; Angular resolution; Epitaxy; Photoemission; Angle-resolved photoemission;Surface electronic phenomena;Silver;Titanium oxide;Single crystal epitaxy
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2008.05.007

Angle-resolved photoemission spectroscopy (ARPES) has been used to study the electronic structure of the TiO film formed on a Ag(1
0
0) surface. The film was prepared by Ti deposition on Ag(1
0
0) at room temperature in an O
2 atmosphere at 3.0
×
10
−9
Torr and subsequent annealing at 600
°C, and the film with the composition of TiO
0.92 was obtained by this procedure. The conduction band and the valence band of the film are observed at 0–2
eV and 4–8
eV, respectively, and thus these bands are separated by a gap of about 2
eV. Resonant photoemission spectroscopy measurements show that the
hν-dependence of the conduction band intensity shows a resonant behavior characteristic of the Ti 3d states. The two-dimensional electronic structure of the states in the conduction band along the
(
Γ
¯
X
¯
)
direction of Ag(1
0
0) are measured with ARPES, and it was found that the states show dispersions consistent with the (1
×
1) periodicity.