Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the su...

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Bibliographic Details
Published in:The European physical journal. D, Atomic, molecular, and optical physics Vol. 51; no. 2; pp. 173 - 177
Main Authors: Emmert, A., Lupaşcu, A., Nogues, G., Brune, M., Raimond, J.-M., Haroche, S.
Format: Journal Article
Language:English
Published: Berlin/Heidelberg Springer-Verlag 2009
EDP Sciences
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Summary:We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the surface and to the wire. Different regimes are observed, where loss rate is determined either by the technical current noise in the wire or the Johnson-Nyquist noise in the metallic gold layer, in good agreement with theoretical predictions. Far from the surface, we observe exceptionally long trapping times for an atom-chip, in the 10 min range.
ISSN:1434-6060
1434-6079
DOI:10.1140/epjd/e2009-00001-5