Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering

• Published in: Ultramicroscopy Vol. 108; no. 12; pp. 1567 - 1578
• Main Authors: D’Alfonso, A.J., Cosgriff, E.C., Findlay, S.D., Behan, G., Kirkland, A.I., Nellist, P.D., Allen, L.J.
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01-11-2008
• Subjects: 61.05.jd; 68.37.Ma; 82.80.Pv; Depth sectioning; Electron energy loss spectroscopy; Scanning confocal electron microscopy (SCEM); Scanning transmission electron microscopy (STEM); 68.37.Ma; Depth sectioning; Scanning transmission electron microscopy (STEM); Scanning confocal electron microscopy (SCEM); 82.80.Pv; 61.05.jd; Electron energy loss spectroscopy
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/j.ultramic.2008.05.007

The implementation of spherical aberration-corrected pre- and post-specimen lenses in the same instrument has facilitated the creation of sub-Ångstrom electron probes and has made aberration-corrected scanning confocal electron microscopy (SCEM) possible. Further to the discussion of elastic SCEM imaging in our previous paper, we show that by performing a 3D raster scan through a crystalline sample using inelastic SCEM imaging it will be possible to determine the location of isolated impurity atoms embedded within a bulk matrix. In particular, the use of electron energy loss spectroscopy based on inner-shell ionization to uniquely identify these atoms is explored. Comparisons with scanning transmission electron microscopy (STEM) are made showing that SCEM will improve both the lateral and depth resolution relative to STEM. In particular, the expected poor resolution of STEM depth sectioning for extended objects is overcome in the SCEM geometry.