Non-Contact Measurement of Current Distribution in Parallel Conductors by Using Hall Sensors

• Published in: IEEE transactions on applied superconductivity Vol. 18; no. 2; pp. 1135 - 1138
• Main Authors: PARK, Myungjin, BYUN, Sangbeom, KIM, Wooseok, LEE, Jikwang, CHOI, Kyeongdal, LEE, Haigun
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01-06-2008; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Conducting materials; Conductors; Copper; Current distribution; Current measurement; Electrical engineering. Electrical power engineering; Electromagnets; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Exact sciences and technology; Finite element method; Hall sensor; Halls; High temperature superconductors; HTS; Inductance; Magnetic field measurement; Magnetic flux density; Magnetic sensors; Mathematical models; Power electronics, power supplies; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Sensors; Superconducting cables; Superconducting devices; Superconductivity; Various equipment and components; Hall effect device; HTS; Power electronics; Hall sensor; Superconductor device; Telemetry; Non uniform distribution; Inductance; Power device; Current distribution; Measurement method; Comparative study; High temperature superconductor; Non contact measurement
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2008.922512

A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.