Orientation Identification of the Black Phosphorus with Different Thickness Based on B2g Mode Using a Micro-Raman Spectroscope under a Nonanalyzer Configuration

• Published in: Materials Vol. 13; no. 23; p. 5572
• Main Authors: Li, Rubing, Shang, Yongchao, Xing, Huadan, Wang, Xiaojie, Sun, Mingyuan, Qiu, Wei
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 07-12-2020; MDPI
• Subjects: B2g mode; black phosphorus; Configurations; Crystal structure; Crystallinity; Experiments; Graphene; Identification methods; Lasers; Light; micro-Raman spectroscope; nonanalyzer configuration; Optoelectronics; Orientation; orientation identification; Phosphorus; Spectrum analysis; Thickness
• ISSN: 1996-1944; 1996-1944
• DOI: 10.3390/ma13235572

As an anisotropic material, the unique optoelectronic properties of black phosphorus are obviously anisotropic. Therefore, non-destructive and fast identification of its crystalline orientation is an important condition for its application in optoelectronics research field. Identifying the crystalline orientation of black phosphorus through Ag1 and Ag2 modes under the parallel polarization has high requirements on the Raman system, while in the nonanalyzer configuration, the crystalline orientation of the thick black phosphorus may not be identified through Ag1 and Ag2 modes. This work proposes a new method to identify the crystalline orientation of black phosphorus of different thicknesses. This method is conducted under the nonanalyzer configuration by B2g mode. The results show that B2g mode has a good consistency in the identification of crystalline orientations. In this paper, a theoretical model is established to study the angle-resolved Raman results of B2g mode. The new method can accurately identify the crystalline orientation with different layers of black phosphorus without misidentification.