Mode Localization and Eigenfrequency Curve Veerings of Two Overhanged Beams

• Published in: Micromachines (Basel) Vol. 12; no. 3; p. 324
• Main Authors: Zhang, Yin, Petrov, Yuri, Zhao, Ya-Pu
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI 19-03-2021; MDPI AG
• Subjects: eigenfrequency curve veering; mode localization; mode splitting; overhang; eigenfrequency curve veering; overhang; mode localization; mode splitting
• ISSN: 2072-666X; 2072-666X
• DOI: 10.3390/mi12030324

Overhang provides a simple but effective way of coupling (sub)structures, which has been widely adopted in the applications of optomechanics, electromechanics, mass sensing resonators, etc. Despite its simplicity, an overhanging structure demonstrates rich and complex dynamics such as mode splitting, localization and eigenfrequency veering. When an eigenfrequency veering occurs, two eigenfrequencies are very close to each other, and the error associated with the numerical discretization procedure can lead to wrong and unphysical computational results. A method of computing the eigenfrequency of two overhanging beams, which involves no numerical discretization procedure, is analytically derived. Based on the method, the mode localization and eigenfrequency veering of the overhanging beams are systematically studied and their variation patterns are summarized. The effects of the overhang geometry and beam mechanical properties on the eigenfrequency veering are also identified.