Hard X-ray nanoprobe at beamline P06 at PETRA III

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 616; no. 2; pp. 93 - 97
• Main Authors: Schroer, Christian G., Boye, Pit, Feldkamp, Jan M., Patommel, Jens, Samberg, Dirk, Schropp, Andreas, Schwab, Andreas, Stephan, Sandra, Falkenberg, Gerald, Wellenreuther, Gerd, Reimers, Nadja
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01-05-2010
• Subjects: Detectors; Focusing; Hard X-ray nanoprobe; Hard X-ray scanning microscope; Nanocomposites; Nanofocusing lenses; Nanomaterials; Nanostructure; Refractive X-ray lenses; Scanning; Spatial resolution; X-rays; Refractive X-ray lenses; Nanofocusing lenses; Hard X-ray nanoprobe; Hard X-ray scanning microscope
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2009.10.094

We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomography. It supports X-ray fluorescence and (coherent) diffraction contrast, yielding elemental and structural information from inside the sample. Spatial resolutions down to well below 50
nm are aimed for in direct space. A further increase in spatial resolution is expected by applying ptychographic scanning schemes. The optical scheme with a two-stage focusing optic is described.