On the nature of CF bonds in various fluorinated carbon materials: XPS and TEM investigations

• Published in: The Journal of physics and chemistry of solids Vol. 57; no. 6; pp. 745 - 751
• Main Authors: Tressaud, A., Moguet, F., Flandrois, S., Chambon, M., Guimon, C., Nanse, G., Papirer, E., Gupta, V., Bahl, O.P.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01-06-1996
• Subjects: A. inorganic compounds; B. plasma enhanced fluorination; C. photoelectron spectroscopy; D. surface properties; D. surface properties; B. plasma enhanced fluorination; C. photoelectron spectroscopy; A. inorganic compounds
• ISSN: 0022-3697; 1879-2553
• DOI: 10.1016/0022-3697(96)00343-5

The different types of CF interactions have been evidenced from XPS investigations on fluorinated carbonaceous materials. The respective amount of the C1s and F1s components depends on several factors, including the nature of the host material, the thermal treatments which increase the graphitization level and the fluorination conditions. TEM images and corresponding Fourier transforms of high temperature-treated pitch-based and PAN-based fibres have shown that only stage-1 compounds and graphitic-type domains are detectable in the experimental conditions. In particular, no interlayer spacing corresponding to higher stage materials has been noticed. The observed results can be correlated to the ratio of semi-ionic to covalent FC bonding determined by XPS.