A new immunity test method

• Published in: IEEE transactions on electromagnetic compatibility Vol. 44; no. 1; pp. 119 - 124
• Main Authors: Murano, K., Kami, Y.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-02-2002; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Electromagnetic compatibility; Electromagnetic fields; Exact sciences and technology; Immunity; Information, signal and communications theory; Mapping; Polarization; Rotating; Telecommunications and information theory; Turntables; Visualization; Rotating field; Wide band; Measuring system; Test method; Electromagnetic compatibility; Electromagnetic field; Mapping
• ISSN: 0018-9375; 1558-187X
• DOI: 10.1109/15.990717

A new measurement system and a mapping technique for immunity or susceptibility testing are discussed. The most unique point of the system is that the electromagnetic (EM) fields are of slowly rotating polarization controlled electronically. In this paper, methods for generating slowly rotating fields are discussed. The direction of field polarization can be varied continuously and in a short time. By combining the method with a turntable, for example, the immunity-or susceptibility-characteristic maps can be obtained easily. This visualization technique is useful to detect the immunity or susceptibility attributes at a glance and thus may make the development of products with high immunity easy.