Coherent laser control of the current through molecular junctions

The electron tunneling through a molecular junction modeled by a single site weakly coupled to two leads is studied in the presence of a time-dependent external field using a master equation approach. In the case of small bias voltages and high carrier frequencies of the external field, we observe t...

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Bibliographic Details
Published in:Europhysics letters Vol. 79; no. 2; p. 27006
Main Authors: Li, G.-Q, Schreiber, M, Kleinekathöfer, U
Format: Journal Article
Language:English
Published: IOP Publishing 01-07-2007
EDP Sciences
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Summary:The electron tunneling through a molecular junction modeled by a single site weakly coupled to two leads is studied in the presence of a time-dependent external field using a master equation approach. In the case of small bias voltages and high carrier frequencies of the external field, we observe the phenomenon of coherent destruction of tunneling, i.e. the current through the molecular junction vanishes completely for certain parameters of the external field. In previous studies the tunneling within isolated and open multi-site systems was suppressed; it is shown here that the tunneling between a single site and electronic reservoirs, i.e. the leads, can be suppressed as well. For larger bias voltages the current does not vanish any more since further tunneling channels participate in the electron conduction and we also observe photon-assisted tunneling which leads to steps in the current-voltage characteristics. The described phenomena are demonstrated not only for monochromatic fields but also for laser pulses and therefore could be used for ultrafast optical switching of the current through molecular junctions.
Bibliography:publisher-ID:epl10368
istex:83EB1AB464120A36940E8113E32CBECDC197AEA6
ark:/67375/80W-TKVPQWLP-Z
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ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/79/27006