Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate

• Published in: Journal of the European Ceramic Society Vol. 21; no. 10; pp. 1445 - 1449
• Main Authors: Tran-Huu-Hue, Pascal, Levassort, Franck, Vander Meulen, François, Holc, Janez, Kosec, Marija, Lethiecq, Marc
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Oxford Elsevier Ltd 2001; Elsevier
• Subjects: Applied sciences; Building materials. Ceramics. Glasses; Ceramic industries; Chemical industry and chemicals; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Dielectric, piezoelectric, ferroelectric and antiferroelectric materials; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Electrotechnical and electronic ceramics; Exact sciences and technology; Impedance; Materials science; Materials synthesis; materials processing; Methods of materials synthesis and materials processing; Niobates, titanates, tantalates, pzt ceramics, etc; Physics; Piezoelectric properties; PZT; Technical ceramics; Tranducers; Piezoelectric properties; Tranducers; PZT; Films; Impedance; Frequency dependence; Lead titanates; Elasticity; Oxide ceramics; Lead zirconates; Inorganic compound; Transducer; Thick film; Imaging; Piezoelectricity; Low temperature; Electroceramics; Electrical impedance; Scanning electron microscopy; Electrical properties; Dielectric properties; Experimental study; Thickness; Substrate; Quaternary compound; Transition metal compounds; Simulation; Sintering; Preparation; Equivalent circuit; Microstructure; Alumina; Electromechanical properties
• ISSN: 0955-2219; 1873-619X
• DOI: 10.1016/S0955-2219(01)00038-3

PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental electrical impedance of several samples as a function of frequency is used to determine the elastic, dielectric and piezoelectric properties in thickness mode of the ceramic layers. Results for different poling fields (3 and 12 kV/mm) and sintering temperatures are obtained. Finally, the KLM equivalent circuit is used to obtain simulations of transducers integrating these thick films and their performance for medical imaging applications is evaluated.