3D Active Edge Silicon Detector Tests With 120 GeV Muons

• Published in: IEEE transactions on nuclear science Vol. 56; no. 2; pp. 505 - 518
• Main Authors: Da Via, C., Deile, M., Hasi, J., Kenney, C., Kok, A., Parker, S., Watts, S., Anelli, G., Avati, V., Bassetti, V., Boccone, V., Bozzo, M., Eggert, K., Ferro, F., Inyakin, A., Kaplon, J., Bahilo, J.L., Morelli, A., Niewiadomski, H., Noschis, E., Oljemark, F., Oriunno, M., Osterberg, K., Ruggiero, G., Snoeys, W., Tapprogge, S.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-04-2009; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: 3D silicon detectors; active edges; Autumn; Detectors; Electrodes; Extraterrestrial measurements; forward proton tagging; Large Hadron Collider; Mesons; Optical scattering; Particle beams; Physics; Protons; radiation hardness; Reference systems; Roman pots; Signal to noise ratio; Silicon; Spark plasma sintering; Testing; Three dimensional
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2009.2013951

3D detectors with electrodes penetrating through the silicon wafer and covering the edges were tested in the SPS beam line X5 at CERN in autumn 2003. Detector parameters including efficiency, signal-to-noise ratio, and edge sensitivity were measured using a silicon telescope as a reference system. The measured sensitive width and the known silicon width were equal within less than 10 mum.