Extended Line Spread Function of TES Microcalorimeters With Au/Bi Absorbers
Microcalorimeters have the potential to provide line shapes well described by a single Gaussian broadening term of few-eV width. This attribute makes the detectors especially well suited for x-ray astrophysics observations; however, low-level non-Gaussian broadening terms are expected and must be ch...
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Published in: | IEEE transactions on applied superconductivity Vol. 29; no. 5; pp. 1 - 5 |
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Main Authors: | , , , , , , , , , , , , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
Goddard Space Flight Center
IEEE
01-08-2019
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
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Summary: | Microcalorimeters have the potential to provide line shapes well described by a single Gaussian broadening term of few-eV width. This attribute makes the detectors especially well suited for x-ray astrophysics observations; however, low-level non-Gaussian broadening terms are expected and must be characterized. These terms depend on the composition of the x-ray absorber, the detailed x-ray absorption physics, the device thermalization processes, and the incident x-ray energy. Here we present the first measurements targeted at understanding the extended line-spread function (LSF) of x-ray microcalorimeter pixels under development for the X-ray Integral Field Unit on the Athena X-ray Observatory. These pixels are composed of Mo/Au transition-edge sensors with overhanging electroplated Au/Bi absorbers. We have measured the line shapes using monochromatic x-ray sources with <; 1-eV width at several x-ray energies (0.85, 0.93, 1.25, 1.5, 5.4 and 8.0 keV) across the instrument bandpass (0.3-12 keV) and have modeled the line profiles. These results are compared to the extended LSF of the Hitomi microcalorimeter pixels that used HgTe absorbers. |
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Bibliography: | GSFC GSFC-E-DAA-TN67838 Goddard Space Flight Center AC52-07NA27344 LLNL-PROC-763321 USDOE National Nuclear Security Administration (NNSA) |
ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/TASC.2019.2903420 |