Handling of the ice protective film for potential use in the 3D microscale analysis of biological samples

• Published in: Surface and interface analysis Vol. 38; no. 12-13; pp. 1658 - 1661
• Main Authors: Iwanami, T., Liu, YuJing, Okazaki, M., Nojima, M., Sakamoto, T., Owari, M.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Chichester, UK John Wiley & Sons, Ltd 01-12-2006; Wiley
• Subjects: Atomic, molecular, and ion beam impact and interactions with surfaces; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron and ion emission by liquids and solids; impact phenomena; Exact sciences and technology; focused ion beam; imaging; Impact phenomena (including electron spectra and sputtering); microscale analysis; Physics; SIMS; Gallium; Inorganic compounds; focused ion beam; Growth rate; Protective layer; Imaging; Microanalysis; Ice; SIMS; Focused ion beam technology; Sputtering; microscale analysis
• ISSN: 0142-2421; 1096-9918
• DOI: 10.1002/sia.2413

The improvement of bioanalytical imaging techniques for biological samples such as single cells is an important theme in biological research. We have investigated handling of the ice protective film in techniques such as gallium focused ion beam (Ga‐FIB) fabrication, SIMS analysis and microscopic observation, which is necessary for the three‐dimensional (3D) microscale analysis of freeze‐non‐dried biological samples in its freshly frozen state. To bring about this 3D microscale analysis, we carried out the following four experiments: (i) Microscopic observation by Ga‐FIB under a water vapor environment; (ii) Evaluation of the balance between the growth rate of the protection film and the sputtering rate in SIMS analysis; (iii) Fabrication of an ice grain with shave‐off scan with no water vapor jet on the sample; (iv) Secondary ion mapping of the ice. The results show that it is possible to carry out the study of 3D microscale analysis of biological samples in their fresh frozen state with the ice protective film. Copyright © 2006 John Wiley & Sons, Ltd.