Analysis of bimorph piezoelectric beam energy harvesters using Timoshenko and Euler–Bernoulli beam theory

Single-degree-of-freedom lumped parameter model, conventional finite element method, and distributed parameter model have been developed to design, analyze, and predict the performance of piezoelectric energy harvesters with reasonable accuracy. In this article, a spectral finite element method for...

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Bibliographic Details
Published in:Journal of intelligent material systems and structures Vol. 24; no. 2; pp. 226 - 239
Main Author: Wang, Gang
Format: Journal Article
Language:English
Published: London, England SAGE Publications 01-01-2013
Sage Publications
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Summary:Single-degree-of-freedom lumped parameter model, conventional finite element method, and distributed parameter model have been developed to design, analyze, and predict the performance of piezoelectric energy harvesters with reasonable accuracy. In this article, a spectral finite element method for bimorph piezoelectric beam energy harvesters is developed based on the Timoshenko beam theory and the Euler–Bernoulli beam theory. Linear piezoelectric constitutive and linear elastic stress/strain models are assumed. Both beam theories are considered in order to examine the validation and applicability of each beam theory for a range of harvester sizes. Using spectral finite element method, a minimum number of elements is required because accurate shape functions are derived using the coupled electromechanical governing equations. Numerical simulations are conducted and validated using existing experimental data from the literature. In addition, parametric studies are carried out to predict the performance of a range of harvester sizes using each beam theory. It is concluded that the Euler–Bernoulli beam theory is sufficient enough to predict the performance of slender piezoelectric beams (slenderness ratio > 20, that is, length over thickness ratio > 20). In contrast, the Timoshenko beam theory, including the effects of shear deformation and rotary inertia, must be used for short piezoelectric beams (slenderness ratio < 5).
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ISSN:1045-389X
1530-8138
DOI:10.1177/1045389X12461080