Nature of the native-defect ESR and hydrogen-dangling-bond centers in thin diamond films
The [ital X]-band ESR of thin diamond films deposited from a mixture of 99.5% H[sub 2] and 0.5% CH[sub 4] is compared to those of films similarly prepared from D[sub 2]-CD[sub 4] and H[sub 2]-[sup 13]CH[sub 4] mixtures. Main line and satellites at [plus minus]7.2 G are unaffected by annealing at [it...
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Published in: | Physical review. B, Condensed matter Vol. 48; no. 23; pp. 17595 - 17598 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
Woodbury, NY
American Physical Society
15-12-1993
American Institute of Physics |
Subjects: | |
Online Access: | Get full text |
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Summary: | The [ital X]-band ESR of thin diamond films deposited from a mixture of 99.5% H[sub 2] and 0.5% CH[sub 4] is compared to those of films similarly prepared from D[sub 2]-CD[sub 4] and H[sub 2]-[sup 13]CH[sub 4] mixtures. Main line and satellites at [plus minus]7.2 G are unaffected by annealing at [ital T][le]1100 [degree]C, but their intensity is reduced upon annealing at [similar to]1500 [degree]C. Since the satellites are absent from the deuterated films, they are attributed to newly identified dangling-bond H centers, possibly on internal surfaces, but more plausibly embedded in the bulk. This is consistent with the [sup 13]C relaxation rate, which indicates a uniform distribution of paramagnetic centers. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 W-7405-ENG-82 |
ISSN: | 0163-1829 1095-3795 |
DOI: | 10.1103/physrevb.48.17595 |