Planar Offset Short Applicable to the Calibration of a Free-Space Material Measurement System in W-Band

• Published in: Journal of Electromagnetic Engineering and Science Vol. 21; no. 1; pp. 51 - 59
• Main Authors: Kang, Jin-Seob, Kim, Jeong-Hwan
• Format: Journal Article
• Language: English
• Published: 한국전자파학회JEES 01-01-2021; The Korean Institute of Electromagnetic Engineering and Science; 한국전자파학회
• Subjects: free space; impedance standard; material measurement; measurement system calibration; reflection standard; 전자/정보통신공학; Free Space; Reflection Standard; Material Measurement; Measurement System Calibration; Impedance Standard
• ISSN: 2671-7255; 2671-7263
• DOI: 10.26866/jees.2021.21.1.51

The electrical properties of materials and their dependence on frequency and temperature are indispensable in designing electromagnetic devices and systems in various areas of engineering and science for both basic and applied researches. A free-space transmission/reflection method measuring the free-space scattering parameters of a material under test (MUT) located at the middle of transmit/receive antennas in a free space is suitable for non-destructively testing the MUT without prior machining or physical contact in high-frequency range. This paper describes a planar offset short applicable to the calibration of a quasi-optic based free-space material measurement system in the millimeter-wave frequency range. The measurement results of the dimensional and electrical properties for the three fabricated planar offset shorts with the phase difference of 120° between the reflection coefficients of the planar shorts in the W-band (75–110 GHz) are presented.