Solar Coronal Structure and Stray Light in TRACE

Using the 2004 Venus transit of the Sun to constrain a semiempirical point-spread function (PSF) for the TRACE EUV solar telescope, we have measured the effect of stray light in that telescope. We find that 43% of 171 A EUV light that enters TRACE is scattered, either through diffraction off the ent...

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Bibliographic Details
Published in:The Astrophysical journal Vol. 690; no. 2; pp. 1264 - 1271
Main Authors: DeForest, C. E, Martens, P. C. H, Wills-Davey, M. J
Format: Journal Article
Language:English
Published: Bristol IOP Publishing 2009
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Summary:Using the 2004 Venus transit of the Sun to constrain a semiempirical point-spread function (PSF) for the TRACE EUV solar telescope, we have measured the effect of stray light in that telescope. We find that 43% of 171 A EUV light that enters TRACE is scattered, either through diffraction off the entrance filter grid or through other nonspecular effects. We carry this result forward, via known-PSF deconvolution of TRACE images, to identify its effect on analysis of TRACE data. Known-PSF deconvolution by this derived PSF greatly reduces the effect of visible haze in the TRACE 171 A images, enhances bright features, and reveals that the smooth background component of the corona is considerably less bright (and hence more rarefied) than might otherwise be supposed. Deconvolution reveals that some prior conclusions about the Sun appear to have been based on stray light in the images. In particular, the diffuse background 'quiet corona' becomes consistent with hydrostatic support of the coronal plasma; feature contrast is greatly increased, possibly affecting derived parameters such as the form of the coronal heating function; and essentially all existing differential emission measure studies of small features appear to be affected by contamination from nearby features. We speculate on further implications of stray light for interpretation of EUV images from TRACE and similar instruments, and advocate deconvolution as a standard tool for image analysis with future instruments.
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ISSN:0004-637X
1538-4357
DOI:10.1088/0004-637X/690/2/1264