Electronic non-coplanar refraction and deflected diffraction of Weyl-node-mismatch junctions

• Published in: New journal of physics Vol. 21; no. 11; pp. 113057 - 113063
• Main Authors: Yang, Mou, Hou, Quan-Teng, Wang, Rui-Qiang
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 01-11-2019
• Subjects: Diffraction; electron optics; electronic transport; Electrons; Nodes; Physics; Refraction; Transport properties; Weyl semimetal
• ISSN: 1367-2630; 1367-2630
• DOI: 10.1088/1367-2630/ab56b9

We studied the transport properties of the Weyl-node-mismatch junction, beside which the Weyl nodes are mismatch so that their projections on the interface plane cannot overlap. When electrons of one valley are injected onto the junction, the refraction is not coplanar with the injection-reflection plane. The non-coplanar deviation angle is valley dependent, and so if the injection consists of both valley components, the birefraction will take place. When electrons coming from a narrow rod transit across the junction into the bulk region on the other side, the electrons will be diffracted in the unconfined region. The diffraction is dispersed near the rod-bulk interface and is laterally deflected to the direction along the line connecting the Weyl node projections of incident and transmitted sides.