Epitaxial Regrowth and Hole Shape Engineering for Photonic Crystal Surface Emitting Lasers (PCSELs)

•III-V void-semiconductor photonic crystal surface emitting laser.•Molecular beam epitaxy regrowth electron beam lithogrpahy.•Effects of regrowth on void/air-hole morphology infilling. In the present research, epitaxial regrowth by molecular beam epitaxy (MBE) is investigated as a fabrication proces...

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Bibliographic Details
Published in:Journal of crystal growth Vol. 535; no. C; p. 125531
Main Authors: Reilly, Kevin J., Kalapala, Akhil, Yeom, Seuongwon, Addamane, Sadhvikas J., Renteria, Emma, Zhou, Weidong, Balakrishnan, Ganesh
Format: Journal Article
Language:English
Published: Amsterdam Elsevier B.V 01-04-2020
Elsevier BV
Elsevier
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Summary:•III-V void-semiconductor photonic crystal surface emitting laser.•Molecular beam epitaxy regrowth electron beam lithogrpahy.•Effects of regrowth on void/air-hole morphology infilling. In the present research, epitaxial regrowth by molecular beam epitaxy (MBE) is investigated as a fabrication process for void-semiconductor photonic crystal (PhC) surface emitting lasers (PCSELs). The PhC is patterned by electron beam lithography (EBL) and inductively coupled plasma (ICP) etch and is subsequently regrown by molecular beam epitaxy to embed a series of voids in bulk semiconductor. Experiments are conducted to investigate the effects of regrowth on air-hole morphology. The resulting voids have a distinct teardrop shape with the radius and depth of the etched hole playing a very critical role in the final regrown void’s dimensions. We demonstrate that specific hole diameters can encourage deposition to the bottom of the voids or to their sidewalls, allowing us to engineer the shape of the void more precisely as is required by the PCSEL design. A 980 nm InGaAs quantum well laser structure is optimized for low threshold lasing at the design wavelength and full device structures are patterned and regrown. An optically pumped PCSEL is demonstrated from this process.
Bibliography:SAND2020-1361J
USDOE National Nuclear Security Administration (NNSA)
AC04-94AL85000; NA-0003525
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2020.125531