Dielectric properties of Ce-doped YAG coatings produced by two techniques of plasma spraying
Yttrium aluminum garnet (YAG) with cerium admixture (Ce:YAG) was plasma sprayed using two different devices – gas-stabilized plasma (GSP) torch and water-stabilized plasma (WSP) torch. Coatings on stainless steel as well as self-standing plates were produced. Besides microstructure and crystallograp...
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Published in: | Boletín de la Sociedad Española de Cerámica y Vidrio (1983) Vol. 61; no. 5; pp. 408 - 416 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
Elsevier España, S.L.U
01-09-2022
Elsevier |
Subjects: | |
Online Access: | Get full text |
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Summary: | Yttrium aluminum garnet (YAG) with cerium admixture (Ce:YAG) was plasma sprayed using two different devices – gas-stabilized plasma (GSP) torch and water-stabilized plasma (WSP) torch. Coatings on stainless steel as well as self-standing plates were produced. Besides microstructure and crystallographic characterizations, dielectric tests were performed on these coatings. They included capacitance (i.e. relative permittivity), loss tangent and volume resistivity measurements. After spraying, the YAG crystal phase was preserved without any decomposition, but an amorphous fraction was detected in the as-sprayed coatings deposited by both processes. The dielectric behavior of the coatings was influenced by imperfections like splat boundaries, pores and thin cracks. The Ce:YAG samples were successfully plasma sprayed by both spray techniques. Selected aspects of wear were measured and compared with a single-crystal. The dielectric properties are comparable with the single-crystal and highly promising, particularly the loss tangent with values so low that they were not found in any other as-sprayed ceramic coating.
Se proyectó con plasma granate de itrio-aluminio (YAG) con aditivo de cerio (Ce:YAG) utilizando dos dispositivos diferentes: antorcha de plasma estabilizado con gas (GSP) y antorcha de plasma estabilizado con agua (WSP). Se produjeron recubrimientos sobre acero inoxidable y placas autoportantes. Además de las caracterizaciones microestructura y cristalográficas, se realizaron pruebas dieléctricas en los revestimientos. Incluyeron medidas de capacitancia (es decir, permitividad relativa), factor de pérdida y resistividad de volumen. Después de la proyección, la fase cristalina de YAG se conservó sin descomposición alguna, pero se detectó una fracción amorfa por ambos procesos. El comportamiento dieléctrico de los revestimientos fue influenciado por imperfecciones como límites, poros y grietas delgadas. Las muestras de Ce:YAG de proyección con plasma con éxito mediante ambas técnicas sin una pérdida irreversible de la fase cristalina deseada. Las propiedades dieléctricas son prometedoras, particularmente el factor de pérdida con valores tan bajos que no se encuentran en ningún revestimiento cerámico pulverizado. |
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ISSN: | 0366-3175 |
DOI: | 10.1016/j.bsecv.2021.02.002 |