Monolithically integrated near-infrared and mid-infrared detector array for spectral imaging

• Published in: Infrared physics & technology Vol. 50; no. 2-3; pp. 211 - 216
• Main Authors: Bandara, S.V., Gunapala, S.D., Ting, D.Z., Liu, J.K., Hill, C.J., Mumolo, J.M., Keo, S.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01-04-2007; Elsevier
• Subjects: Applied sciences; Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors; Electronics; Exact sciences and technology; Infrared imaging; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Multicolor; Optoelectronic devices; Physics; Quantum well; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Spectrometer; Quantum well; Multicolor; Spectrometer; Infrared imaging; Infrared detectors; Integrated optics; Focal plane arrays; Radiation detectors; Interband transitions; Photodetectors; Photodiodes; Dectector arrays; Thermal imaging; Quantum well devices; III-V semiconductors
• ISSN: 1350-4495; 1879-0275
• DOI: 10.1016/j.infrared.2006.10.030

A multi-band focal plane array sensitive in near-infrared (near-IR) and mid-wavelength infrared (MWIR) is been developed by monolithically integrating a near-infrared (1–1.5μm) p–i–n photodiode with a mid-infrared (3–5μm) QWIP. This multiband detector involves both intersubband and interband transitions in III–V semiconductor layer structures. Each detector stack absorbs photons within the specified wavelength band, while allowing the transmission of photons in other spectral bands, thus efficiently permitting multiband detection. Monolithically grown material characterization data and individual detector test results ensure the high quality of material suitable for near-infrared/QWIP dual-band focal plane array.