In situ quantitative analysis of stress and texture development in forsterite aggregates deformed at 6 GPa and 1373 K
The investigation of materials plastic properties at high pressure is a fast‐growing field, owing to the coupling of high‐pressure deformation apparatuses with X‐ray synchrotron radiation. In such devices, materials strain and strain rate are measured by time‐resolved radiography, while differential...
Saved in:
Published in: | Journal of applied crystallography Vol. 45; no. 2; pp. 263 - 271 |
---|---|
Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01-04-2012
|
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | The investigation of materials plastic properties at high pressure is a fast‐growing field, owing to the coupling of high‐pressure deformation apparatuses with X‐ray synchrotron radiation. In such devices, materials strain and strain rate are measured by time‐resolved radiography, while differential stress is deduced from the elastic response of the d spacing of the crystallographic planes as measured by X‐ray diffraction. Here a new protocol is presented, which allows the in situ measurement of stress and texture development in aggregates deformed at high pressure for experiments carried out with the recently installed ten‐element energy‐dispersive detector at the X17B2 beamline of the National Synchrotron Light Source (Brookhaven National Laboratory, Upton, NY, USA). Cycling deformation of a forsterite specimen was carried out at a pressure of ∼6 GPa and a temperature of ∼1373 K, using a deformation‐DIA apparatus. Diffraction peak energies are analysed in terms of differential stress and principal stress direction, while the intensities of peaks obtained at different azimuths are analysed in terms of lattice preferred orientation (LPO). The development and evolution of a marked LPO, with the (010) plane perpendicular to the compression axis, is observed in situ during the run and is confirmed by electron backscatter diffraction measurements on the run product. |
---|---|
Bibliography: | ark:/67375/WNG-R1SRVW1W-J istex:88E5021AACBD8A7EC0C26E460E289529A912AB60 ArticleID:JCRRW5008 BNL-100318-2013-JA DE-AC02-98CH10886 USDOE SC OFFICE OF SCIENCE (SC) |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S002188981200516X |