Noise analysis of the quantum flux parametron

• Published in: IEEE transactions on applied superconductivity Vol. 2; no. 3; pp. 156 - 164
• Main Authors: Ko, H.L., Lee, G.S.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01-09-1992; Institute of Electrical and Electronics Engineers
• Subjects: Application software; Applied sciences; Circuit noise; Circuit properties; Circuit simulation; Circuits of signal characteristics conditioning (including delay circuits); Delay effects; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Electronics packaging; Exact sciences and technology; Frequency; Hysteresis; Inductors; Quantum computing; Superconducting device noise; Josephson junction; Network analysis; Equivalent circuit; Current comparator; Numerical simulation; Thermal noise; Superconductor device; Performance; Modeling; Discriminator
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/77.160155

An analysis of the limitations imposed by thermal noise on the application of the quantum flux parametrons (QFPs) as current comparators and timing discriminators is presented. At low operational frequencies, a thermal activation approach is used, while at high frequencies a circuit simulation method is required. At frequencies greater than the Josephson junction plasma frequency, an approximate expression for the noise is given. The calculations are in good agreement with the approximations and the experimental results.< >