Effect of high-frequency electrodynamic environment on the single-electron tunneling in ultrasmall junctions

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Bibliographic Details
Published in:Physical review letters Vol. 63; no. 11; pp. 1180 - 1183
Main Authors: DELSING, P, LIKHAREV, K. K, KUZMIN, L. S, CLAESON, T
Format: Journal Article
Language:English
Published: Ridge, NY American Physical Society 11-09-1989
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content type line 23
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.63.1180