Inter-diffusion effects in as-deposited Al/Ni polycrystalline multi-layers

• Published in: Surface and interface analysis Vol. 40; no. 9; pp. 1318 - 1321
• Main Authors: Salou, M., Rioual, S., Ben Youssef, J., Dekadjevi, D. T., Pogossian, S. P., Jonnard, P., Le Guen, K., Gamblin, G., Rouvellou, B.
• Format: Journal Article
• Language: English
• Published: Chichester, UK John Wiley & Sons, Ltd 01-09-2008; Wiley; Wiley-Blackwell
• Subjects: Condensed Matter; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; inter-diffusion; multi-layer structure; nickel aluminium; Physics; XES; XPS depth profile; XRD; XES; Interdiffusion; Aluminium; XRD; Multilayers; multi-layer structure; Emission spectra; Transition elements; XPS depth profile; nickel aluminium; Nickel; X-ray emission spectra; inter-diffusion; Depth profiles; X-ray photoelectron spectra
• ISSN: 0142-2421; 1096-9918
• DOI: 10.1002/sia.2896

Al/Ni multi‐layers, deposited by magnetron sputtering at room temperature have been studied by complementary techniques; XPS, sputter depth profiling, electron‐induced X‐ray emission spectroscopy (XES) and X‐ray diffraction (XRD). XPS depth profile technique evidenced an atomic diffusion dominated by Ni atoms. Moreover, the Ni diffusion results in the formation of an amorphous phase with a stoichiometry close to the Al3Ni aluminide. Copyright © 2008 John Wiley & Sons, Ltd.