Determination of Temperature Gradients with Micrometric Resolution by Local Open Circuit Potential Measurements at a Scanning Microelectrode

A method to determine localized temperature profiles using a scanning electrochemical microscopy (SECM) setup and potentiometry is presented. A Pt microelectrode was first calibrated to correlate the open circuit potential (OCP) with temperature in an electrolyte containing ferri/ferrocyanide. Using...

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Bibliographic Details
Published in:Electroanalysis (New York, N.Y.) Vol. 25; no. 9; pp. 2084 - 2091
Main Authors: Sode, Aya, Nebel, Michaela, Pinyou, Piyanut, Schmaderer, Sebastian, Szeponik, Jan, Plumeré, Nicolas, Schuhmann, Wolfgang
Format: Journal Article
Language:English
Published: Weinheim WILEY-VCH Verlag 01-09-2013
WILEY‐VCH Verlag
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Summary:A method to determine localized temperature profiles using a scanning electrochemical microscopy (SECM) setup and potentiometry is presented. A Pt microelectrode was first calibrated to correlate the open circuit potential (OCP) with temperature in an electrolyte containing ferri/ferrocyanide. Using the calibration graph, the temperature at a given position and a time could be derived. For dynamic measurements, the thermal expansion of the surface was initially determined using shear force mode SECM. Following the OCP at the microelectrode static as well as dynamic temperature gradients above the heated surface were successfully probed and visualized with vertical micrometric resolution and with precision in temperature determination below 1 °C.
Bibliography:istex:1F6089977237D01129214E5C35A96898A15DC3E3
ArticleID:ELAN201300258
Bundesministerium für Bildung und Forschung (BMBF) within the Project Taschentuchlabor - No. 03IS2201F
ark:/67375/WNG-R2CR2DCV-5
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1040-0397
1521-4109
DOI:10.1002/elan.201300258