Texture development during the Bi(2223)/Ag multifilamentary tape processing
We have developed a method that allows, by a simple set of magnetic measurements, to study the texturing of the grains inside Ag-sheathed (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+x/ tapes by means of two representative angles, /spl theta//sub L/ and /spl theta//sub T/. They identify the mea...
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Published in: | IEEE transactions on applied superconductivity Vol. 11; no. 1; pp. 2987 - 2990 |
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Main Authors: | , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
New York, NY
IEEE
01-03-2001
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
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Summary: | We have developed a method that allows, by a simple set of magnetic measurements, to study the texturing of the grains inside Ag-sheathed (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+x/ tapes by means of two representative angles, /spl theta//sub L/ and /spl theta//sub T/. They identify the mean grain misalignment with respect to the tape surface respectively in longitudinal (i.e. the rolling direction) and transverse direction. Here we present the texture evolution of the superconducting grains inside silver sheathed multifilamentary tapes prepared in different ways. We have started our investigation from the initial steps of the mechanical deformation up to the final thermal treatment stage. We will compare the results obtained by the magnetic method to more traditional ones, i.e. X-ray diffraction and critical current density anisotropy measurements. Finally the advantages and the limits of the magnetic method will be briefly discussed. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/77.919690 |