IR Spectroscopy for Precision Monitoring of Iron and Chromium Impurity Diffusion Profiles in Zinc Chalcogenides

• Published in: Technical physics Vol. 63; no. 7; pp. 1079 - 1083
• Main Authors: Kotereva, T. V., Ikonnikov, V. B., Gavrishchuk, E. M., Potapov, A. M., Savin, D. V.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01-07-2018; Springer; Springer Nature B.V
• Subjects: CHALCOGENIDES; Chemical vapor deposition; Chromium; Chromium (Metal); CHROMIUM ADDITIONS; Classical and Continuum Physics; CONCENTRATION RATIO; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DIFFUSION; Dopants; DOPED MATERIALS; Environmental monitoring; Experimental Instruments and Technique; IMPURITIES; INFRARED SPECTRA; Infrared spectroscopy; IRON ADDITIONS; LASER RADIATION; Micrometers; MICROSCOPES; Monitoring; NONDESTRUCTIVE TESTING; Physics; Physics and Astronomy; SPATIAL RESOLUTION; Spectroscopy; Spectrum analysis; Zinc; ZINC COMPOUNDS
• ISSN: 1063-7842; 1090-6525
• DOI: 10.1134/S1063784218070204

A technique for precision rapid nondestructive monitoring of the dopant behavior in zinc chalcogenide–based laser media is reported. Results suggest that it is possible to determine the concentration profiles of Fe
2+
and Cr
2+
dopant ions in zinc chalcogenide by IR spectroscopy combined with an IR microscope in the concentration rage 5 × 10
17
–2.5 × 10
20
atoms/cm
3
with a spatial resolution of several micrometers. The diffusion profiles of dopants have been taken for zinc chalcogenide codoped by several impurities.