Coupling of imaging NEXAFS with secondary ion mass spectrometry for the chemical and isotopic analysis of presolar cosmic grains

We present first results of the combination of imaging photoemission electron spectroscopy with imaging mass spectrometry. Imaging NEXAFS was combined with TOF-SIMS in order to perform a spatially resolved chemical and isotopic analysis of microscopic grain samples. Imaging NEXAFS was used for the n...

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Bibliographic Details
Published in:	Analytical and bioanalytical chemistry Vol. 386; no. 1; pp. 119 - 124
Main Authors:	Berg, Thomas, Maul, Jochen, Erdmann, Nicole, Bernhard, Pasqual, Schuppler, Stefan, Nagel, Peter, Sudek, Christa, Ott, Ulrich, Schönhense, Gerd
Format:	Journal Article
Language:	English
Published:	Germany Berlin/Heidelberg : Springer-Verlag 01-09-2006 Springer Nature B.V
Subjects:	Imaging Ions Mass spectrometry Mass spectroscopy Mineral phases Murchison meteorite NEXAFS PEEM Photoelectric emission Presolar grains Scientific imaging Secondary ion mass spectrometry Spectroscopy TOF-SIMS
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Summary:	We present first results of the combination of imaging photoemission electron spectroscopy with imaging mass spectrometry. Imaging NEXAFS was combined with TOF-SIMS in order to perform a spatially resolved chemical and isotopic analysis of microscopic grain samples. Imaging NEXAFS was used for the nondestructive lateral characterization of mineral phases prior to isotopically resolved mass analysis by imaging TOF-SIMS. This novel approach was demonstrated by performing a chemical and isotopic analysis of the rare presolar grain fraction present in the Murchison meteorite.
Bibliography:	http://dx.doi.org/10.1007/s00216-006-0590-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2
ISSN:	1618-2642 1618-2650
DOI:	10.1007/s00216-006-0590-3