Effect of substrate temperatures on the electrical resistivity of thermally evaporated Mn thin films

• Published in: Cryogenics (Guildford) Vol. 47; no. 3; pp. 153 - 157
• Main Authors: Boakye, F., Ampong, F.K., Abavare, E.K.K.
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 01-03-2007; Elsevier
• Subjects: Applied sciences; Cryogenics; Energy; Energy. Thermal use of fuels; Exact sciences and technology; Kondo scattering; Manganese; Metallic-alloy-glass; Refrigerating engineering. Cryogenics. Food conservation; Resistivity; Kondo scattering; Metallic-alloy-glass; Resistivity; Manganese; Alloys; Cryogenics; Electric resistivity; Very low temperature; Evaporation; High temperature; Low temperature; Thin film
• ISSN: 0011-2275; 1879-2235
• DOI: 10.1016/j.cryogenics.2006.11.001

Resistivity measurements have been performed on three samples of Mn thin films from 300 to 1.4
K using the van der Pauw four probe technique. The films were grown by thermal evaporation onto glass substrates held at 523, 323 and 77
K, respectively in a bell jar held at 6
×
10
−6
Torr. The resistivity–temperature results of the three specimens reveal a variety of low temperature behaviours. A behaviour typical of the bulk α-Mn is obtained with the film grown at a substrate temperature of 523
K whilst with the film grown at a substrate temperature of 323
K, the resistivity tends to a saturation at low temperatures exhibiting a behaviour reminiscent of Kondo scattering. The resistivity–temperature behaviour of the sample held at a substrate temperature of 77
K may be regarded as typical of a metallic alloy glass with a negative temperature coefficient of resistivity at high temperatures and this turns to a
T
2 dependence of resistivity at very low temperatures.