The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector

The two-slits experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope a thick sample with two nano-slits fabricated by Focused Ion Beam technique and a fast recording system able to measure the electron arrival-time. The detector, designed...

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Bibliographic Details
Published in:Ultramicroscopy Vol. 116; pp. 73 - 76
Main Authors: Frabboni, Stefano, Gabrielli, Alessandro, Carlo Gazzadi, Gian, Giorgi, Filippo, Matteucci, Giorgio, Pozzi, Giulio, Cesari, Nicola Semprini, Villa, Mauro, Zoccoli, Antonio
Format: Journal Article
Language:English
Published: Elsevier B.V 01-05-2012
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Summary:The two-slits experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope a thick sample with two nano-slits fabricated by Focused Ion Beam technique and a fast recording system able to measure the electron arrival-time. The detector, designed for experiments in future colliders, is based on a custom CMOS chip equipped with a fast readout chain able to manage up to 106 frames per second. In this way, high statistic samples of single electron events can be collected within a time interval short enough to measure the distribution of the electron arrival-times and to observe the build-up of the interference pattern. ► We present the first results obtained regarding the two-slits Young-Feynman experiment with single electrons. ► We use two nano-slits fabricated by Focused Ion Beam technique. ► We insert in the transmission electron microscope a detector, designed for experiments in future colliders. ► We record the build-up of high statistic single electron interference patterns. ► We measure the time distribution of electron arrivals.
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ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2012.03.017