The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector
The two-slits experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope a thick sample with two nano-slits fabricated by Focused Ion Beam technique and a fast recording system able to measure the electron arrival-time. The detector, designed...
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Published in: | Ultramicroscopy Vol. 116; pp. 73 - 76 |
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Main Authors: | , , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Elsevier B.V
01-05-2012
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Subjects: | |
Online Access: | Get full text |
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Summary: | The two-slits experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope a thick sample with two nano-slits fabricated by Focused Ion Beam technique and a fast recording system able to measure the electron arrival-time. The detector, designed for experiments in future colliders, is based on a custom CMOS chip equipped with a fast readout chain able to manage up to 106 frames per second. In this way, high statistic samples of single electron events can be collected within a time interval short enough to measure the distribution of the electron arrival-times and to observe the build-up of the interference pattern.
► We present the first results obtained regarding the two-slits Young-Feynman experiment with single electrons. ► We use two nano-slits fabricated by Focused Ion Beam technique. ► We insert in the transmission electron microscope a detector, designed for experiments in future colliders. ► We record the build-up of high statistic single electron interference patterns. ► We measure the time distribution of electron arrivals. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ISSN: | 0304-3991 1879-2723 |
DOI: | 10.1016/j.ultramic.2012.03.017 |