Study of Barrier Structures on the Base of Nickel Phthalocyanine Thin Films During the Interaction with the Ammonia Medium

Thin films of the α polymorphic modification of a nickel phthalocyanine (NiPc) which possess a high sensitivity to actions of gaseous media are deposited by the thermal vacuum deposition method. Indium tin oxide (ITO) continuous thin films on glass are used as substrates. On the basis of these films...

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Bibliographic Details
Published in:	Molecular crystals and liquid crystals (Philadelphia, Pa. : 2003) Vol. 496; no. 1; pp. 131 - 137
Main Authors:	Cherpak, V. V., Stakhira, P. Y., Kuntyy, O. I., Zakutayev, A.
Format:	Journal Article
Language:	English
Published:	Taylor & Francis Group 01-01-2008
Subjects:	ammonia electrogeneration effect nickel phthalocyanine
Online Access:	Get full text
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Summary:	Thin films of the α polymorphic modification of a nickel phthalocyanine (NiPc) which possess a high sensitivity to actions of gaseous media are deposited by the thermal vacuum deposition method. Indium tin oxide (ITO) continuous thin films on glass are used as substrates. On the basis of these films, the barrier structure ITO/NiPc/Al has been formed. We have found that there exists the electrogeneration effect in the ITO/NiPc/Al structure under the action of the gaseous ammonia medium. The appearance of a short circuit current and an open circuit voltage is observed only in the ITO/NiPc/Al structures that can be explained by redox reactions.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	1542-1406 1563-5287 1543-5318
DOI:	10.1080/15421400802451568