Nanoscopic Morphological Changes in Yeast Cell Surfaces Caused by Oxidative Stress: An Atomic Force Microscopic Study
Nanoscopic changes in the cell surface morphology of the yeasts Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces, pombe (strain DVPB 1354), due to their exposure to varying concentrations of hydrogen peroxide (oxidative stress), were investigated using an atomic force microscope (...
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Published in: | Journal of microbiology and biotechnology Vol. 19; no. 6; pp. 547 - 555 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
Seoul
Korean Society for Applied Microbiology
01-06-2009
한국미생물·생명공학회 |
Subjects: | |
Online Access: | Get full text |
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Summary: | Nanoscopic changes in the cell surface morphology of the yeasts Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces, pombe (strain DVPB 1354), due to their exposure to varying concentrations of hydrogen peroxide (oxidative stress), were investigated using an atomic force microscope (AFM). Increasing hydrogen peroxide concentration led to a decrease in cell viabilities and mean cell volumes, and an increase in the surface roughness of the yeasts. In addition, AFM studies revealed that oxidative stress caused cell compression in both S. cerevisiae and Schiz. pombe cells and an increase in the number of aged yeasts. These results confirmed the importance and usefulness of AFM in investigating the morphology of stressed microbial cells at the nanoscale. The results also provided novel information on the relative oxidative stress tolerance of S. cerevisiae and Schiz. pombe. |
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Bibliography: | A50 2010002332 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 G704-000169.2009.19.6.002 |
ISSN: | 1017-7825 1738-8872 |
DOI: | 10.4014/jmb.0809.515 |