Surface image generation using local slope-based mapping algorithm

Surface image generation using local slope-based mapping algorithm

This paper introduces a novel technique to provide the microtopographical details of a machined surface using a fiber‐optic probe. Unlike the previous methods, the present approach involves pixel‐to‐pixel scanning for slope measurement, which in turn generates the three‐dimensional profile of the pr...

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Bibliographic Details
Published in:Microwave and optical technology letters Vol. 26; no. 2; pp. 127 - 132
Main Authors: Pal, Sarit, Kak, S. K.
Format: Journal Article
Language:English
Published: New York John Wiley & Sons, Inc 20-07-2000
Subjects:
fiber-optic sensors
image sensors
mapping algorithm
optical profilometer
precision surface metrology
signal processing
surface roughness
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Summary:This paper introduces a novel technique to provide the microtopographical details of a machined surface using a fiber‐optic probe. Unlike the previous methods, the present approach involves pixel‐to‐pixel scanning for slope measurement, which in turn generates the three‐dimensional profile of the probed surface using the relevant mapping algorithm. Minute details of the surface roughness characteristics, including slope and height at different positions, can be visualized from the reconstructed surface image. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 26: 127–132, 2000.
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content type line 23
ISSN:0895-2477
1098-2760
DOI:10.1002/1098-2760(20000720)26:2<127::AID-MOP18>3.0.CO;2-3