The impact of ASIC devices on the SEU vulnerability of space-borne computers

• Published in: IEEE transactions on nuclear science Vol. 39; no. 6; pp. 1685 - 1692
• Main Authors: Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J., Pinkerton, S.D., Tsubota, T.K.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01-12-1992; Institute of Electrical and Electronics Engineers
• Subjects: Application specific integrated circuits; Applied sciences; CMOS logic circuits; CMOS technology; Computers, microcomputers; Electronics; Exact sciences and technology; Field programmable gate arrays; Hardware; Large scale integration; Logic devices; Power dissipation; Programmable logic arrays; Single event upset; Testing
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/23.211354

Application-specific integrated circuits (ASICs) offer a number of advantages over traditional multicomponent microcircuits, including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset (SEU) and latchup are reported and are compared to the susceptibilities of the devices that they would replace. This comparison leads to a discussion of the impact of ASIC devices on the SEU susceptibility of spaceborne computers.< >