Single-event upset in the PowerPC750 microprocessor

Single-event upset in the PowerPC750 microprocessor

Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results,...

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Bibliographic Details
Published in:IEEE transactions on nuclear science Vol. 48; no. 6; pp. 1822 - 1827
Main Authors: Swift, G.M., Fannanesh, F.F., Guertin, S.M., Irom, F., Millward, D.G.
Format: Journal Article
Language:English
Published: New York IEEE 01-12-2001
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Laboratories
Malfunctions
Manufacturing processes
Materials testing
Microprocessors
Propulsion
Protons
Registers
Space exploration
Space missions
Space technology
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Summary:Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/23.983136