High-speed optoelectronic pulse generation and sampling system

A very-high-frequency (>100-GHz) optoelectronic pulsing and sampling system is presented. This system is used for the characterization of high-speed electronic devices and transmission line structures, and for the study of electronic transport phenomena at picosecond time scales. The signal-to-no...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement Vol. 37; no. 3; pp. 449 - 453
Main Author: Paulter, N.G.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-09-1988
Institute of Electrical and Electronics Engineers
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Summary:A very-high-frequency (>100-GHz) optoelectronic pulsing and sampling system is presented. This system is used for the characterization of high-speed electronic devices and transmission line structures, and for the study of electronic transport phenomena at picosecond time scales. The signal-to-noise ratio obtained in this system is greater than 50 dB, the sensitivity limit is approximately 1 mu V/Hz/sup 1/2/, and the temporal resolution can be less than 1 ps, thereby permitting studies of very fast low-level signals.< >
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0018-9456
1557-9662
DOI:10.1109/19.7473