High-speed optoelectronic pulse generation and sampling system
A very-high-frequency (>100-GHz) optoelectronic pulsing and sampling system is presented. This system is used for the characterization of high-speed electronic devices and transmission line structures, and for the study of electronic transport phenomena at picosecond time scales. The signal-to-no...
Saved in:
Published in: | IEEE transactions on instrumentation and measurement Vol. 37; no. 3; pp. 449 - 453 |
---|---|
Main Author: | |
Format: | Journal Article |
Language: | English |
Published: |
New York, NY
IEEE
01-09-1988
Institute of Electrical and Electronics Engineers |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | A very-high-frequency (>100-GHz) optoelectronic pulsing and sampling system is presented. This system is used for the characterization of high-speed electronic devices and transmission line structures, and for the study of electronic transport phenomena at picosecond time scales. The signal-to-noise ratio obtained in this system is greater than 50 dB, the sensitivity limit is approximately 1 mu V/Hz/sup 1/2/, and the temporal resolution can be less than 1 ps, thereby permitting studies of very fast low-level signals.< > |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9456 1557-9662 |
DOI: | 10.1109/19.7473 |